Patent overlay mapping: Visualizing technological distance
نویسندگان
چکیده
منابع مشابه
Patent overlay mapping: Visualizing technological distance
Luciano Kay, Center for Nanotechnology in Society, University of California Santa Barbara, Santa Barbara, CA, USA, e-mail: [email protected] Nils Newman, Intelligent Information Services Corporation, Atlanta, GA, USA, email: [email protected] Jan Youtie, Enterprise Innovation Institute & School of Public Policy, Atlanta, GA, USA, e-mail: [email protected] Alan L. Porter, School o...
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ژورنال
عنوان ژورنال: Journal of the Association for Information Science and Technology
سال: 2014
ISSN: 2330-1635
DOI: 10.1002/asi.23146